陆纲,田卫,张豹山,许卫东,杨燚,陆怀先

• 1:南京大学物理系
• 2:南京大学物理系
• 3:南京大学物理系
• 4:南京大学物理系

摘要(Abstract)：

用直流磁控溅射法制备了Fe1-xBx薄膜。用谐振腔点频测试其微波磁损耗。测试结果和理论计算基本相符。研究了薄膜的制备工艺、组分、厚度、各向异性场、饱和磁化强度和阻尼系数等对微波磁损耗的影响。发现增大薄膜的各向异性场或饱和磁化强度、适当增大阻尼系数对提高磁损耗和展宽共振峰频带有益,而且阻尼系数的微小变化将对磁损耗值产生重要作用。试验也表明制备工艺、薄膜组分、厚度对磁损耗具有重要影响。

关键词(KeyWords)： 纳米薄膜;微波参数;磁损耗

Abstract:

Keywords:

基金项目(Foundation): 国防973项目资助

作者(Author): 陆纲,田卫,张豹山,许卫东,杨燚,陆怀先

Email:

DOI: 10.14024/j.cnki.1004-244x.2005.05.008

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